Logic Design for Array-Based Circuits

Copyright © 1996, 2001, 2002, 2008, 2016 Donnamaie E. White , WhitePubs Enterprises, Inc.

• Table of Contents
  
• Preface
  
• Overview
  
• Chapter 1 Introduction
  
• Chapter 2 Structured Design Methodology
• Chapter 3 Sizing the Design
• Chapter 3 Appendix = Case Study in Sizing a Design
• Chapter 4 Design Optimization
• Chapter 5 Timing Analysis for Arrays
• Chapter 6 External Set-up and Hold Times
• Chapter 7 Power Considerations
• Case Study: DC Power Computation
• Case Study: AC Power Computation
• Chapter 8 Simulation
• Case Study: Simulation
• Chapter 9 Faults and Fault Detection
  • Introduction
  • Controllability
  • Observability
  • Masking a Fault
  • Fault Types
  • Fault Equivalencies
  • Single Stuck-At Faults
  • Minimal Test Sets
  • Example Test Set
  • The Problem
  • Combinatorial Circuit
  • Formation Rules for the Existence Function
  • Forming Links
  • Selecting a Chain
  • Advantages of the Test Sequence
  • Simple Gates - Sequences
  • Extension to Three-State and Bidirectional Structures
  • Extension to Sequential Circuits
  • Reference
• Case Study - 16:1 MUX D Flip/Flop Circuit
  • 100% Fault-Grade Vector Set
  • The Marquand Map
  • 2;1 MUX Example
  • 3:1 MUX Example
  • 16:1 MUX Actual Test Vectors
• Chapter 10 Design Submission
• ASIC Glossary
  • Glossary A-D
  • Glossary E-K
  • Glossary L-R
  • Glossary S-Z
  • Symbols

Faults and Fault Detection

Last Edit July 22, 2001

16:1 MUX Actual Test Vectors

Figure 9-19 Actual Test Vector Sequence For A 16:1 Mux With Clocked Output

Copyright © 1996, 2001, 2002, 2008, 2016 Donnamaie E. White , WhitePubs Enterprises, Inc.
For problems or questions on these pages, contact [email protected]